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大学物理实验, 2026, 39(5): 82-88     https://doi.org/10.14139/j.cnki.cn22-1228.2026.05.014
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基于模式匹配算法的抗干扰型微小位移测量仪设计#br#
周乃云 1 ,彭玉平 1 ,吴贵琳 2
1.武昌首义学院 信息科学与工程学院,湖北 武汉 430064;2.武昌首义学院 基础科学部,湖北 武汉 430064
Design of Anti-interference Micro-displacement Measuring Instrument Based on Pattern Matching Algorithm#br#
ZHOU Naiyun 1 ,PENG Yuping 1 ,WU Guiling 2
1.School of Information Science and Engineering,Wuchang Shouyi University,Wuhan 40064,China;2.School of Basic Science,Wuchang Shouyi University,Wuhan 40064,China
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摘要 本项目提出了一种基于斑点检测技术以及 STM32F103 单片机、k230 摄像头与显示屏构成的等厚干涉改进仪器测量微小位移的方案。传统劈尖干涉测量方法受限于人工读数误差及数据处理效率,难以实现实时动态测量。实验中,采用钠光灯作为光源,劈尖装置形成等厚干涉条纹。改进方案通过引入 STM32F103 单片机作为核心控制器,结合高分辨率摄像头捕捉干涉条纹的实时图像传输至 PC端,由于计算机视觉难以判断移动方向,MATLAB 中使用斑点检测图像的圆形区域,在此基础上利用模
式匹配算法增强对比度,再自动计数移动条纹,测量明暗条纹的距离,通过对比明暗条纹的距离来验证计数准确性并计算移位;同时实现对条纹移动方向的判断。根据软件自动计算所得条纹移动数目与位移量的线性关系,实时计算微小位移值;最后对计算的微小位移与移动条纹数用 MATLAB 进行拟合分析从而减少误差。此外,考虑环境对测量系统的影响,如振动、器件潮湿和环境光等对测量影响的克服;配备显示屏,直观展示实验结果,便于实时监控。改进后的仪器有效克服了传统方法的局限性,显著提高了测量精度与效率,实现了微小位移的实时动态测量。
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周乃云
彭玉平
吴贵琳
关键词:  斑点检测技术  模式匹配算法  等厚干涉法  STM32F103 单片机  k230 摄像头    
Abstract: This project proposes a scheme for measuring minute displacements using spot detection technology
and an improved equal-thickness interference instrument composed of an STM32F103 microcontroller,an k230
camera,and a display screen.Traditional wedge interferometry is limited by manual reading errors and data
processing efficiency,making it difficult to achieve real-time dynamic measurement.In the experiment,a sodium
lamp is used as the light source,and the wedge device forms equal-thickness interference fringes.The improved
scheme introduces an STM32F103 microcontroller as the core controller,combined with a high-resolution
camera to capture real-time images of the interference fringes and transmit them to the PC.Since computer
vision has difficulty determining the direction of movement,spot detection is used in MATLAB to detect the
circular area of the image.On this basis,a pattern matching algorithm is used to enhance the contrast,and then
the moving fringes are automatically counted,and the distance between the bright and dark fringes is measured.
The accuracy of the count is verified by comparing the distances of the bright and dark fringes to calculate the
displacement;at the same time,the direction of the fringe movement is determined. Based on the linear
relationship between the number of moving fringes and the displacement value automatically calculated by the
software,the minute displacement value is calculated in real time.Finally,the calculated minute displacement
and the number of moving fringes are fitted and analyzed using MATLAB to reduce errors.In addition,the
influence of the environment on the measurement system,such as vibration,device moisture,and ambient light,
is considered and overcome. A display screen is equipped to visually present the experimental results and
facilitate real-time monitoring.The improved instrument effectively overcomes the limitations of the traditional
method,significantly improves measurement accuracy and efficiency,and realizes real-time dynamic
measurement of minute displacements.
Key words:  Spot detection technology    Pattern matching algorithm    Equal thickness interference method    STM32F103 single-chip microcomputer    k230 camera
                    发布日期:  2026-10-21     
:  TP 391.9   
基金资助: 武昌首义学院实验技术研究项目(SY202403)
引用本文:    
周乃云 , 彭玉平 , 吴贵琳 . 基于模式匹配算法的抗干扰型微小位移测量仪设计#br#[J]. 大学物理实验, 2026, 39(5): 82-88.
ZHOU Naiyun , PENG Yuping , WU Guiling . Design of Anti-interference Micro-displacement Measuring Instrument Based on Pattern Matching Algorithm#br#. Physical Experiment of College, 2026, 39(5): 82-88.
链接本文:  
https://dawushiyan.jluct.edu.cn/CN/10.14139/j.cnki.cn22-1228.2026.05.014  或          https://dawushiyan.jluct.edu.cn/CN/Y2026/V39/I5/82
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